Digital circuit testing and testability / Parag K.Lala.

By: Lala, Parag KCall number: 621.395 L194D 1997 Material type: BookBookPublisher: San Diego : Academic Press, c1997Description: xii, 199 p. : chart, tables ; 24 cmISBN: 0124343309Subject(s): Integrated circuits -- Very large scale integration -- Testing | Digital integrated circuits -- Testing | Integrated circuits -- Fault toleranceDDC classification: 621.395 L194D 1997
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General Books General Books สำนักวิทยบริการ (Center)
ชั้น 7 หนังสือทั่วไปภาษาอังกฤษ 000-900 		621.395 L194D 1997 (Browse shelf(Opens below)) 1 Available 2000068406

Includes bibliographical rferences and index.

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